DLTS of grown-in dislocations in p- and n- type high-purity germanium

Author:

Simoen E.,Clauws P.,Vennik J.

Publisher

Elsevier BV

Subject

Materials Chemistry,Condensed Matter Physics,General Chemistry

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Unintentional p-type conductivity in intrinsic Ge-rich SiGe/Ge heterostructures grown on Si(001);Applied Physics Letters;2023-06-12

2. Preparation of high purity germanium single crystal and analysis of dislocation density;Journal of Shenzhen University Science and Engineering;2022-09-01

3. Device-Based Threading Dislocation Assessment in Germanium Hetero-Epitaxy;2019 34th Symposium on Microelectronics Technology and Devices (SBMicro);2019-08

4. Impact of Defects on the Performance of High-Mobility Semiconductor Devices;High Mobility Materials for CMOS Applications;2018

5. Characterization of Shallow- and Deep-Level Defects in Undoped Ge1−xSnxEpitaxial Layers by Electrical Measurements;ECS Journal of Solid State Science and Technology;2015-12-30

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