Aberration Corrected High-Resolution Transmission and Scanning Transmission Electron Microscopy of Thin Perovskite Layers
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Published:2013
Issue:
Volume:40
Page:49-55
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ISSN:1875-3892
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Container-title:Physics Procedia
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language:en
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Short-container-title:Physics Procedia
Author:
Walther T.,Ross I.M.
Subject
General Engineering
Cited by
5 articles.
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