Configuring a 300kV cold field-emission gun for optimum analytical performance
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy
Link
http://stacks.iop.org/1742-6596/371/i=1/a=012012/pdf
Reference6 articles.
1. Preliminary Results from the First Monochromated and Aberration Corrected 200-kV Field-Emission Scanning Transmission Electron Microscope
2. STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
3. Field emission ultrahigh-resolution analytical electron microscope
4. First experimental test of a new monochromated and aberration-corrected 200kV field-emission scanning transmission electron microscope
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