Determination of the hydrogen concentration of silicon nitride layers by Fourier transform infrared spectroscopy
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference5 articles.
1. Dielectric Materials in Semiconductor Devices
2. Microelectronic Materials;Grovenor,1989
3. Silicon nitride thin-film deposition by LPCVD with in situ HF vapor cleaning and its application to stacked DRAM capacitor fabrication
4. W.R. Knolle, Report AT&T Bell Laboratories, Reading, PA 19607, unpublished.
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Effects of Hydrogen Bonding in Silicon Nitride/Polyimide Passivation Bilayer in SiC Power Devices;physica status solidi (a);2024-06-02
2. Reducing Time and Costs of FT-IR Studies of the Effect of SiNx, Dopants, and Emitter on Hydrogen Species in Si Wafers and Solar Cell Structures;SiliconPV Conference Proceedings;2024-02-22
3. Differences in HF Wet Etching Resistance of PECVD SiNx:H thin films;Materials Chemistry and Physics;2023-09
4. Characterization of light induced degradation in PECVD silicon nitride passivated Cz silicon wafers using spectroscopic techniques;Surfaces and Interfaces;2023-06
5. Effects of hydrogen content in films on the etching of LPCVD and PECVD SiN films using CF 4 /H 2 plasma at different substrate temperatures;Plasma Processes and Polymers;2021-08-04
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3