1. International Technology Roadmap for Semiconductors (ITRS) 2005. [Online]. Available: http://public.itrs.net.
2. Segment Weighted Random BIST (SWR-BIST) Technique For Low Power Testing;Chun-Yi Lee;Bulletin of the College of Engineering N. T. U.,2005
3. Minimal March Tests for Unlinked Static Faults in Random Access Memories;Harutunyan;Proc. of VTS,2005
4. March SS: A Test or All Static Simple RAM Faults;Hamdioui;Proc. of MTDT,2002
5. March AB, March AB1: New March Tests for Unlinked Dynamic Memory Faults;Benso;Proc. of ITC,2005