Publisher
Springer Science and Business Media LLC
Subject
Hardware and Architecture,Software
Reference24 articles.
1. Reda S, Orailoglu A (2002) Reducing test application time through test data mutation encoding. In: Proceedings design, automation and test in Europe, conference and exhibition (DATE 02). IEEE CS Press, pp 387–393
2. Koenemann B, Barnhart C, Keller B, Snethen T, Farnsworth O, Wheater D (2001) A smart BIST variant with guaranteed encoding. In: 10th Asian test symposium, proceedings, pp 325–330
3. Chandra A, Chakrabarty K (2003) Test data compression and test resource partitioning for system-on-a-chip using frequency-directed run-length (FDR) codes. IEEE Trans Comput 52(8):1076–1088
4. Würtenberger A, Tautermann CS, Hellebrand S (2004) Data compression for multiple scan chains using dictionaries with corrections. In: Proceedings of international test conference (ITC 04). IEEE CS Press, pp 926–935
5. Wang Z, Chakrabarty K (2005) Test data compression for IP embedded cores using selective encoding of scan slices. In: Proceedings of international test conference (ITC 05). IEEE Press, pp 581–590
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献