Influence of off-cut angle of (0001) 4H-SiC on the crystal quality of InN grown by RF-MBE
Author:
Publisher
Elsevier BV
Subject
Applied Mathematics
Reference10 articles.
1. Absorption and Emission of Hexagonal InN Evidence of Narrow Fundamental Band Gap Phys;Davydov;Stat. Sol.,2002
2. Indium nitride (InN): A review on growth, characterization, and properties;Bhuiyan;J. Appl. Phys.,2003
3. Growth and characterization of InN on sapphire substrate by RF-MBE;Xiao;J. Cryst. Growth,2005
4. Structural properties of 10 μm thick InN grown on sapphire (0001);Dimakis;Superlattices and Microstructures,2006
5. Investigation of preparation and characterization of GaN films on sapphire (0001) substrates;Yang;Applied Surface Science,2002
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3. Effect of nitridation time on structural, optical and electrical properties of InN films grown on c-sapphire substrates by PAMBE;Journal of Materials Science: Materials in Electronics;2017-11-28
4. Tuning the effective band gap and finding the optimal growth condition of InN thin films on GaN/sapphire substrates by plasma assisted molecular beam epitaxy technique;Superlattices and Microstructures;2017-01
5. First-principles simulation of the chemical reactions in GaN growth from Ga2O;Japanese Journal of Applied Physics;2014-10-08
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