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Improving the reliability of chip-off forensic analysis of NAND flash memory devices

  • Published:2017-03 Issue: Volume:20 Page:S1-S11
  • ISSN:1742-2876
  • Container-title:Digital Investigation
  • language:en
  • Short-container-title:Digital Investigation

Author:

Fukami Aya,Ghose Saugata,Luo Yixin,Cai Yu,Mutlu Onur

Publisher

Elsevier BV

Subject

Law,Medical Laboratory Technology,Computer Science Applications

Reference56 articles.

1. Über die Reaktionsgeschwindigkeit bei der Inversion von Rohrzucker durch Säuren;Arrhenius,1889

2. Guidelines on Mobile Device Forensics;Ayers,2014

3. A new reliability model for post-cycling charge retention of flash memories;Belgal,2002

4. Chip-off by matter subtraction: Frigida via;Billard,2015

5. On a Class of Error Correcting Binary Group Codes;Bose,1960

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2. The Integrated Physical Data Extraction Methods for Mobile Forensics Using Bootloader and Flasher Boxes;2024 International Conference on Intelligent Systems for Cybersecurity (ISCS);2024-05-03

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4. A Comprehensive Data Retrieval and Correction Approach From 40-nm Flash Memory With Selective Chemical Engraving;IEEE Transactions on Information Forensics and Security;2024

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