Molecular sputtering and damage induced by kiloelectron ions in organic monolayer—metal systems
Author:
Publisher
Elsevier BV
Subject
Spectroscopy
Reference20 articles.
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2. Mechanisms in molecular SIMS
3. Some aspects of secondary ion mass spectrometry of organic compounds
4. Variation of yield with thickness in SIMS and PDMS: Measurements of secondary ion emission from organized molecular films
5. Sample film-thickness influence on fast heavy-ion induced desorption yields of biomolecular ions
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3. SIMS for Organic Film Analysis;Mass Spectrometry Handbook;2012-05-21
4. Primary ion fluence dependence in time-of-flight SIMS of a self-assembled monolayer of octadecylphosphonic acid molecules on mica discussion of static limit;Canadian Journal of Chemistry;2007-12-01
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