Some aspects of secondary ion mass spectrometry of organic compounds-Reference-Cited by-同舟云学术

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Some aspects of secondary ion mass spectrometry of organic compounds

Published:1983-09 Issue: Volume:53 Page:85-99
ISSN:0020-7381
Container-title:International Journal of Mass Spectrometry and Ion Physics
language:en
Short-container-title:International Journal of Mass Spectrometry and Ion Physics

Author:

Benninghoven A.

Publisher

Elsevier BV

Subject

Spectroscopy

Reference30 articles.

1. Ion Formation from Organic Solids,1983

2. Die Analyse monomolekularer FestkörperoberflÄchenschichten mit Hilfe der SekundÄrionenemission

3. Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)

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