Time-of-flight secondary ion mass spectrometry of wet and dry chemically treated display glass surfaces-Reference-Cited by-同舟云学术

Time-of-flight secondary ion mass spectrometry of wet and dry chemically treated display glass surfaces

Published:2017-06-02 Issue:10 Volume:100 Page:4770-4784
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J Am Ceram Soc

Author:

Cushman Cody V.¹,Zakel Julia²,Sturgell Brandon S.¹,Major George I.¹,Lunt Barry M.³,Brüner Philipp²,Grehl Thomas²^ORCID,Smith Nicholas J.⁴,Linford Matthew R.¹^ORCID

Affiliation:

1. Department of Chemistry and Biochemistry; College of Physical and Mathematical Sciences; Brigham Young University; Provo Utah

2. IONTOF GmbH; Münster Germany

3. Department of Information Technology; College of Engineering; Brigham Young University; Provo Utah

4. Science and Technology Division; Corning Incorporated; Corning New York

Funder

Corning Incorporated Foundation

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.14967/fullpdf

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