Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction-Reference-Cited by-同舟云学术

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Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction

Published:2003-12 Issue:20 Volume:51 Page:6253-6261
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Choi W.J.,Lee T.Y.,Tu K.N.,Tamura N.,Celestre R.S.,MacDowell A.A.,Bong Y.Y.,Nguyen Luu

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Minimization of tin whisker formation for lead‐free electronics finishing

2. Elastic and Plastic Properties of Very Small Metal Specimens

3. A Tentative Theory of Metallic Whisker Growth

4. Growth of Metal Whiskers

5. Growth and perfection of crystals;Nabarro,1958

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