IC manufacturing test cost estimation at early stages of the design cycle

Author:

Chen Tom,Von-Kyoung Kim,Tegethoff Mick

Publisher

Elsevier BV

Subject

General Engineering

Reference21 articles.

1. C. Dislis, I. Dear, J. Miles, S. Lau, A. Ambler., Cost analysis of test method environments, in: International Test Conference, 1989, pp. 875–883.

2. C. Dislis, J. Dick, A. Ambler, Algorithms for cost optimized test strategy selection, in: International Test Conference, 1993, pp. 383–391.

3. Test strategy planning using economic analysis;Dear;Journal of Electronic Testing Theory and Practice,1994

4. High level test economics advisor (Hi-TEA);Abadir;Journal of Electronic Testing Theory and Practice,1994

5. H. Druckerman, M. Kusco, S. Peteras, P. Shephard III, Cost trade-offs of various design for test techniques, in: Proc. of Econo. Des. Test. Manuf., 1993, pp. 45–50.

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