Author:
Adam W.,Berdermann E.,Bergonzo P.,Bertuccio G.,Bogani F.,Borchi E.,Brambilla A.,Bruzzi M.,Colledani C.,Conway J.,Dangelo P.,Dabrowski W.,Delpierre P.,Deneuville A.,Dulinski W.,van Eijk B.,Fallou A.,Fizzotti F.,Foulon F.,Friedl M.,Gan K.K.,Gheeraert E.,Grigoriev E.,Hallewell G.,Han S.,Hartjes F.,Hrubec J.,Husson D.,Kagan H.,Kania D.,Kaplon J.,Karl C.,Kass R.,Krammer M.,Logiudice A.,Lu R.,Manfredotti C.,Meier D.,Mishina M.,Moroni L.,Oh A.,Pan L.S.,Pernicka M.,Peitz A.,Pirollo S.,Polesello P.,Procario M.,Riester J.L.,Roe S.,Rousseau L.,Rudge A.,Russ J.,Sala S.,Sampietro M.,Schnetzer S.,Sciortino S.,Stelzer H.,Stone R.,Suter B.,Tapper R.J.,Tesarek R.,Trawick M.,Trischuk W.,D.Tromson ,Vittone E.,Walsh A.M.,Wedenig R.,Weilhammer P.,White C.,Zeuner W.,Zoeller M.,Fenyvesi A.,Molnar J.,Sohler D.
Subject
Instrumentation,Nuclear and High Energy Physics
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