Author:
Meier D.,Adam W.,Bauer C.,Berdermann E.,Bergonzo P.,Bogani F.,Borchi E.,Bruzzi M.,Colledani C.,Conway J.,Dabrowski W.,Delpierre P.,Deneuville A.,Dulinski W.,van Eijk B.,Fallou A.,Foulon F.,Friedl M.,Jany C.,Gan K.K.,Gheeraert E.,Grigoriev E.,Hallewell G.,Hall-Wilton R.,Han S.,Hartjes F.,Hrubec J.,Husson D.,Kagan H.,Kania D.,Kaplon J.,Kass R.,Knöpfle K.T.,Krammer M.,Manfredi P.F.,Marshall R.D.,Mishina M.,Le Normand F.,Pan L.S.,Palmieri V.G.,Pernegger H.,Pernicka M.,Peitz A.,Pirollo S.,Pretzl K.,Re V.,Riester J.L.,Roe S.,Roff D.,Rudge A.,Schnetzer S.,Sciortino S.,Speziali V.,Stelzer H.,Stone R.,Tapper R.J.,Tesarek R.,Thomson G.B.,Trawick M.,Trischuk W.,Turchetta R.,Walsh A.M.,Wedenig R.,Weilhammer P.,Ziock H.,Zoeller M.
Subject
Instrumentation,Nuclear and High Energy Physics
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