Local investigation of the electrical properties of grain boundaries
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Local investigation of recombination at grain boundaries in silicon by grain boundary‐electron beam induced current
2. Grain boundary recombination: Theory and experiment in silicon
3. Polycrystalline Semiconductors II;Marfaing,1991
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