Determination of refractive indexes of In0.52Al0.48As on InP in the wavelength range from 250 to 1900 nm by spectroscopic ellipsometry
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference7 articles.
1. Proc. 4th Euro. Conf. on Integrated Optics;Krauser,1987
2. Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry
3. Optical properties ofIn1−xGaxAsyP1−yfrom 1.5 to 6.0 eV determined by spectroscopic ellipsometry
4. Optical properties of In1−xGaxP1−yAsy, InP, GaAs, and GaP determined by ellipsometry
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Potential sources of compositional inaccuracy in the atom probe tomography of InxGa1-xAs;Ultramicroscopy;2020-03
2. Study of In0.53Ga0.47As/In0.52Al0.48As quantum wells on InP by spectroscopic ellipsometry and photoluminescence;Surface Science;1994-04
3. Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47−xAs layers on InP in the wavelength range 280–1900 nm;Materials Science and Engineering: B;1993-11
4. Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47 – xAs layers on InP in the wavelength range 280–1900 nm;European Materials Research Society Symposia Proceedings;1993
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