Author:
Dinges H.W.,Burkhard H.,Lösch R.,Nickel H.,Schlapp W.
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2. Refractive indices of InAlAs and InGaAs/InP from 250 to 1900 nm determined by spectroscopic ellipsometry
3. Optical properties ofIn1−xGaxAsyP1−yfrom 1.5 to 6.0 eV determined by spectroscopic ellipsometry
4. Optical properties of In1−xGaxP1−yAsy, InP, GaAs, and GaP determined by ellipsometry
5. Determination of refractive indexes of In0.52Al0.48As on InP in the wavelength range from 250 to 1900 nm by spectroscopic ellipsometry