Silicon homoepitaxy using photochemical vapor deposition: a reflection high energy electron diffraction and transmission electron microscopy study
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference13 articles.
1. ArF excimer laser induced photolytic growth of Si homoepitaxial films from Si2H6at 330 °C
2. Homoepitaxial films grown on Si (100) at 150 °C by remote plasma‐enhanced chemical vapor deposition
3. Low‐temperature silicon epitaxy by ultrahigh vacuum/chemical vapor deposition
4. Silicon molecular beam epitaxy
5. Silicon epitaxy at 650–800 °C using low‐pressure chemical vapor deposition both with and without plasma enhancement
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Growth and characterization of silicon thin films employing supersonic jets of SiH4 on polysilicon and Si(100);Journal of Applied Physics;1997-12-15
2. Growth and characterization of silicon thin films employing supersonic jets;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1997-07
3. Surface morphology of homoepitaxial silicon thin films grown using energetic supersonic jets of disilane;Applied Physics Letters;1996-08-19
4. Epitaxial silicon growth using supersonic jets of disilane: A model study of energetic jet deposition;Applied Physics Letters;1995-11-13
5. ArF excimer laser-enhanced photochemical vapor deposition of epitaxial Si from Si2H6: A simple growth kinetic model;Journal of Electronic Materials;1992-08
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