Author:
Palmour J.W.,Lipkin L.A.,Singh R.,Slater D.B.,Suvorov A.V.,Carter C.H.
Subject
Electrical and Electronic Engineering,Materials Chemistry,Mechanical Engineering,General Chemistry,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Improved oxidation procedures for reduced SiO2/SiC defects
2. Trans. Second High Temp. Electronics Conf.;Brown,1996
3. Trans. Third High Temp. Electronics Conf.;Lipkin,1996
4. Abstracts of Third All-Union Conference on Wide-Gap Semiconductors;Suvorov,1986
Cited by
26 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献