In-situ X-ray tomographic imaging and controlled steering of microcracks in 3D nanopatterned structures
Author:
Funder
Semiconductor Research Corporation
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
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3. Laboratory X-ray Microscopy of 3D Nanostructures in the Hard X-ray Regime Enabled by a Combination of Multilayer X-ray Optics;Nanomaterials;2024-01-21
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