Ionization and diffusion of metal atoms under electric field at metal/insulator interfaces; First-principles study
Author:
Funder
MEXT KAKENHI
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference28 articles.
1. Nano-scale view of atom intermixing at metal/semiconductor interfaces
2. Why and How Atom Intermixing Proceeds at Metal/Si Interfaces; Silicide Formation vs. Random Mixing
3. Diffusion of Metals in Silicon Dioxide
4. Structural and electrical characteristics of Ge nanoclusters embedded in Al2O3 gate dielectric
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