Optical characterization of dislocation free Ge and GeOI wafers
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Grown-In Lattice Defects and Diffusion in Czochralski-Grown Germanium
2. Local vibrational mode spectroscopy of dimer and other oxygen-related defects in irradiated and thermally annealed germanium
3. Radiation‐induced defects and their transformations in oxygen‐rich germanium crystals
4. Infrared Absorption at Longitudinal Optic Frequency in Cubic Crystal Films
5. Experimental Evidence of Birefringence by Free Carriers in Semiconductors
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