A deep-level transient spectroscopy study of Co- and Ni-germanided n-type germanium-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

A deep-level transient spectroscopy study of Co- and Ni-germanided n-type germanium

Published:2006-08 Issue:4-5 Volume:9 Page:554-558
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Opsomer K.,Simoen E.,Claeys C.,Maex K.,Detavernier C.,Van Meirhaeghe R.L.,Forment S.,Clauws P.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference19 articles.

1. Characterization of nickel Germanide thin films for use as contacts to p-channel Germanium MOSFETs

2. Germanium pMOSFETs with Schottky-barrier germanide S/D, high-/spl kappa/ gate dielectric and metal gate

3. Formation of titanium and cobalt germanides on Si (100) using rapid thermal processing

4. Phase transitions during solid‐state formation of cobalt germanide by rapid thermal annealing

5. Deep level transient spectroscopy study of nickel-germanide Schottky barriers on n-type germanium

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cobalt germanide contacts: growth reaction, phase formation models, and electrical properties;Journal of Materials Science: Materials in Electronics;2019-05-18

2. Application of remote hydrogen plasma to selective processing for Ge-based devices: Crystallization, etching, and metallization;Japanese Journal of Applied Physics;2014-09-30

3. Effect of thermal treatment on the characteristics of iridium Schottky barrier diodes on n-Ge (100);Journal of Alloys and Compounds;2012-02

4. Junction and Device Characteristics of Gate-Last Ge p- and n-MOSFETs With ALD- $\hbox{Al}_{2}\hbox{O}_{3}$ Gate Dielectric;IEEE Transactions on Electron Devices;2009-08

5. Microstructural Evolution and Electrical Characteristics of Co-Germanide Contacts on Ge;Journal of The Electrochemical Society;2009

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3