Effects of Mg incorporation in cubic GaN films grown by PAMBE near Ga rich conditions-Reference-Cited by-同舟云学术

Effects of Mg incorporation in cubic GaN films grown by PAMBE near Ga rich conditions

Published:2019-04 Issue: Volume:93 Page:196-200
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Compeán-García V.D.,Moreno-García H.,López-Luna E.,Pérez Ladrón de Guevara H.,Escobosa Echavarría A.,Kudriavtsev Y.,Rodríguez-Aranda F.J.,Rodríguez A.G.,Vidal M.A.

Funder

CEMIE Sol

Consejo Nacional de Ciencia y Tecnología

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference24 articles.

1. Optical properties of cubic GaN from 1 to 20 eV;Feneberg;Phys. Rev. B,2012

2. Bulk lattice parameter and band gap of cubic InXGa1-XN (001) alloys on MgO (100) substrates;Compeán García;J. Cryst. Growth,2015

3. Carrier localization and the origin of luminescence in cubic InGaN alloys;Kent;Appl. Phys. Lett.,2001

4. Photoluminescence measurements on cubic InGaN layers deposited on a SiC substrate;Pacheco-Salazar;Semicond. Sci. Technol.,2006

5. Optical properties of the cubic alloy (In,Ga)N;Berrah;Physica E,2009

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review of the Properties of GaN, InN, and Their Alloys Obtained in Cubic Phase on MgO Substrates by Plasma-Enhanced Molecular Beam Epitaxy;Crystals;2024-09-11

2. First principles insight into magneto-electronic and optical properties of half-metallic-ferromagnetism binary GaN compound for spintronic applications;Indian Journal of Physics;2024-08-30

3. Measurement of spin-polarized photoemission from wurtzite and zinc blende gallium nitride photocathodes;Applied Physics Letters;2024-07-15

4. MOVPE studies of zincblende GaN on 3C-SiC/Si(0 0 1);Journal of Crystal Growth;2023-06

5. Polarity determination of crystal defects in zincblende GaN by aberration-corrected electron microscopy;Journal of Applied Physics;2023-03-09