Author:
Flores Víctor H.,Rivera Mariano
Subject
Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference40 articles.
1. Optical Shop Testing;Malacara,2007
2. Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications;Servín,2014
3. Temporal phase measurement methods;Creath;Interf. Anal.,1993
4. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry;Takeda;J. Opt. Soc. Am. A,1982
5. Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures;Carré;Metrologia,1966
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