Analysis of organic multilayer structures using a combined grazing incidence X-ray fluorescence/X-ray reflectometry approach-Reference-Cited by-同舟云学术

Analysis of organic multilayer structures using a combined grazing incidence X-ray fluorescence/X-ray reflectometry approach

Published:2018-10 Issue: Volume:148 Page:188-192
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Maderitsch Angelika,Ingerle Dieter^ORCID,Bretschneider Thomas,Rauwolf Mirjam^ORCID,Pflumm Christof,Buchholz Herwig,Borchert Holger,Streli Christina,Parisi Jürgen

Funder

Merck KGaA

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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