Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis-Reference-Cited by-同舟云学术

Quantitative depth-profile analysis of transition metal nitride materials with combined grazing-incidence X-ray fluorescence and X-ray reflectometry analysis

Published:2020-09 Issue: Volume:171 Page:105926
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Torrengo S.,Eichert D.,Mazel Y.,Bernard M.,Ménesguen Y.,Lépy M.C.,Nolot E.

Funder

European Metrology Programme for Innovation and Research

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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