Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments-Reference-Cited by-同舟云学术

Grazing incident X-ray fluorescence combined with X-ray reflectometry metrology protocol of telluride-based films using in-lab and synchrotron instruments

Published:2018-11 Issue: Volume:149 Page:143-149
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Pessoa W.,Roule A.,Nolot E.,Mazel Y.,Bernard M.,Lépy M.-C.,Ménesguen Y.,Novikova A.,Gergaud P.,Brigidi F.,Eichert D.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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