Standardless determination of nanometric thicknesses in stratified samples by electron probe microanalysis-Reference-Cited by-同舟云学术

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Standardless determination of nanometric thicknesses in stratified samples by electron probe microanalysis

Published:2020-09 Issue: Volume:171 Page:105932
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Pereyra G.D.,Oliva F.Y.,Budini N.,Risso G.,Pérez P.D.,Suárez S.,Trincavelli J.C.

Funder

Universidad Nacional de Córdoba

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference64 articles.

1. Thin dielectric film thickness determination by advanced transmission electron microscopy;Diebold;Microsc. Microanal.,2004

2. Graphene thickness determination using reflection and contrast spectroscopy;Ni;Nano Lett.,2007

3. Thickness determination of a nanofilm by means of a temperature factor;Horiuchi;Optical Materials,2006

4. Nanostructured materials for advanced energy conversion and storage devices;Aricò;Nat. Mater.,2005

5. Recent developments in nanostructured anode materials for rechargeable lithium-ion batteries;Ji;Energy Environ. Sci.,2011

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