Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces-Reference-Cited by-同舟云学术

Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces

Published:2014-08 Issue: Volume:98 Page:65-75
ISSN:0584-8547
Container-title:Spectrochimica Acta Part B: Atomic Spectroscopy
language:en
Short-container-title:Spectrochimica Acta Part B: Atomic Spectroscopy

Author:

Nowak S.H.,Banaś D.,Błchucki W.,Cao W.,Dousse J.-Cl.,Hönicke P.,Hoszowska J.,Jabłoński Ł.,Kayser Y.,Kubala-Kukuś A.,Pajek M.,Reinhardt F.,Savu A.V.,Szlachetko J.

Publisher

Elsevier BV

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

Reference52 articles.

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4. Applications of the ‘CATGIXRF’ computer program to the grazing incidence X-ray fluorescence and X-ray reflectivity characterization of thin films and surfaces;Tiwari;X-Ray Spectrom.,2010

5. Geometrical optics modelling of grazing incidence X-ray fluorescence of nanoscaled objects;Nowak;J. Anal. At. Spectrom.,2013

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