X-ray diffraction imaging—A multi-generational perspective
Author:
Publisher
Elsevier BV
Subject
Radiation
Reference10 articles.
1. Nuclear Terrorism: A Threat Assessment for the 21st Century;Cameron,1999
2. Harding, G., 2005. The design of direct tomographic, energy-dispersive X-ray diffraction imaging (XDI) systems. In: Proc SPIE 59230R.
3. Harding, G., 2008. Potential of x-ray diffraction for detecting Special Nuclear Materials (SNMs). accepted for publication. In: Larry A. Franks, Arnold Burger, Ralph B. James, H. Bradford Barber, F. Patrick Doty, Hans Roehrig (Eds.), Proceedings of the SPIE 7080, Hard X-Ray and Gamma-Ray Detector Physics and Penetrating Radiation Systems IX.
4. Harding, G., Delfs, J., 2007. Liquids identification by X-ray diffraction. In: Patrick Doty, F., Bradford Barber, H., Hans Roehrig, (Eds.), Proceedings of the SPIE Vol. 6707, Penetrating Radiation Systems and Applications VIII.
5. X-ray diffraction imaging;Harding,2007
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