Morphology and electric conductance of ultra-thin Cr contacts on 6H-SiC(0001): AFM and current-sensing AFM study
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference19 articles.
1. SiC material for high-power applications
2. Silicon carbide as a new MEMS technology
3. Current SiC technology for power electronic devices beyond Si
4. A critical review of ohmic and rectifying contacts for silicon carbide
5. Surface barrier height in metal-SiC structures of 6H, 4H and 3C polytypes
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Formation of Cr ohmic contact on graphitized 6H-SiC(0001) surface;OPT APPL;2013
2. Characterization of coating probe with Ti-DLC for electrical scanning probe microscope;Applied Surface Science;2011-06
3. Sensing current and forces with SPM;Materials Today;2010-10
4. Characterization of Cr/6H-SiC(0001) nano-contacts by current-sensing AFM;Applied Surface Science;2009-11
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