Characterization of coating probe with Ti-DLC for electrical scanning probe microscope-Reference-Cited by-同舟云学术

Characterization of coating probe with Ti-DLC for electrical scanning probe microscope

Published:2011-06 Issue:16 Volume:257 Page:7238-7244
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Shia Xiaolei,Guo Liqiu,Bai Yang,Qiao Lijie

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference18 articles.

1. Terabit-per-square-inch data storage with the atomic force microscope

2. AFM studies of the effect of temperature and electric field on the structure of a DMPC-cholesterol bilayer supported on a Au(111) electrode surface;Chen;Langmuir,2009

3. Scanning capacitance microscopy with ZrO2 as dielectric material

4. Mapping the influence of stress on the surface elasticity with an atomic force microscope;Finot;Appl. Phys. Lett.,1998

5. Morphology and electric conductance of ultra-thin Cr contacts on 6H-SiC(0001): AFM and current-sensing AFM study;Mazur;Vacuum,2007

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Existence state of Ti in diamond-like carbon coatings and its effects on hybrid structure and residual stress: Molecular dynamics simulations;Computational Materials Science;2024-02

2. Characteristics of DLC films doped with multi-element alloy;The International Journal of Advanced Manufacturing Technology;2022-06-14

3. Achieving ultralow surface roughness and high material removal rate in fused silica via a novel acid SiO2 slurry and its chemical-mechanical polishing mechanism;Applied Surface Science;2020-01

4. Structural, morphological, electrical and optical properties of Cu doped DLC thin films;Materials Research Express;2019-11-29

5. 350 KeV Cu2+ ions induced modification in structural, morphological and electrical properties of Au doped DLC thin films;Materials Research Express;2019-04-03