Concurrent checking for VLSI-Reference-Cited by-同舟云学术

Concurrent checking for VLSI

Published:1999-11 Issue:1-2 Volume:49 Page:139-156
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Nicolaidis M.,Anghel L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference75 articles.

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3. On-Totally Self-Checking Checkers for Separable Codes;Ashjaee;IEEE Trans. on Comp.,1973

4. QTAG: A Standard for Test Fixture based IDDQISSQ Monitors;Baker,1994

5. Attenuation of Single Event Induced Pulses in CMOS Combinational Logic;Baze;IEEE Trans. on Nuclear Science,1997

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3. On-Line Testing of digital VLSI circuits at Register Transfer Level using High Level Decision Diagrams;Microelectronics Journal;2017-09

4. A novel differential XOR-based self-checking adder;International Journal of Electronics;2012-09

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