Coherent X-ray imaging investigation of macrodefects and micropipes on SiC
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference8 articles.
1. Quantitative analysis of screw dislocations in 6H−SiC single crystals
2. Defect analysis in Lely-grown 6H SiC
3. Temperature gradient controlled SiC crystal growth
4. Defects formation in sublimation grown 6H-SiC single crystal boules
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1. Quantitative hard x-ray phase contrast imaging of micropipes in SiC;AIP Advances;2013-12
2. Elliptical micropipes in SiC revealed by computer simulating phase contrast images;physica status solidi (a);2009-06-22
3. Computer simulation of phase-contrast images in white synchrotron radiation using micropipes in silicon carbide;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2008-12
4. New materials for radiation hard semiconductor dectectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2006-02
5. Cross-polarization imaging and micro-raman detection of defects in the epitaxy of 4H-SiC;Journal of Electronic Materials;2005-04
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