1. Reliability studies of surface mount solder joints—effect of Cu–Sn intermetallic compounds;So;IEEE Trans. CPMT-B,1996
2. Effect of intermetallic compounds on the thermal fatigue of surface mount solder joints;Tu;IEEE Trans. CPMT-B,1997
3. Y.C. Chan, P.L. Tu, Alex C.K. So, J.K.L. Lai, Effect of intermetallic compounds on the shear fatigue of Cu/63Sn–37Pb solder joints, IEEE Trans. CPMT-B, Nov. 1997 (to be published).
4. Y.C. Chan, J.K.L. Lai, Alex C.K. So, Y. Tian, P.L. Tu, Reliability of Surface Mount Solder Joints in Microelectronic Packaging and Assembly, Proc. of 2nd. Int. Symp. on Elect. Packag. Technol., Dec. 1996, pp. 484–490.
5. S.F. Dirnfeld, J.J. Ramon, Microstructure investigation of copper–tin intermetallics and the influence of layer thickness on shear strength, suppl. to Weld. J., Oct 1990, 373–377s.