An advanced technique for measuring minority-carrier parameters and defect properties of semiconductors-Reference-Cited by-同舟云学术

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An advanced technique for measuring minority-carrier parameters and defect properties of semiconductors

Published:2003-09 Issue:1-3 Volume:102 Page:161-172
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Ahrenkiel R.K.,Johnston S.W.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference22 articles.

1. The study of charge carrier kinetics in semiconductors by microwave conductivity measurements

2. Contactless measurement of recombination lifetime in photovoltaic materials

3. R.K. Ahrenkiel, S.W. Johnston, Mat. Res. Soc. Symp. Proc., Materials Research Society, 510, 1998, pp. 575–581.

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3. Monitoring carrier transport and recombination in photovoltaic devices in real time;Physics, Simulation, and Photonic Engineering of Photovoltaic Devices VIII;2019-02-27

4. Quantitative analysis of time-resolved microwave conductivity data;Journal of Physics D: Applied Physics;2017-11-10

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