Electrical properties of SiC: characterisation of bulk crystals and epilayers-Reference-Cited by-同舟云学术

Electrical properties of SiC: characterisation of bulk crystals and epilayers

Published:2002-04 Issue: Volume:91-92 Page:358-366
ISSN:0921-5107
Container-title:Materials Science and Engineering: B
language:en
Short-container-title:Materials Science and Engineering: B

Author:

Irmscher K.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference25 articles.

1. Silicon Carbide and Related Materials ECSRM2000, Proc. 3rd Eur. Conf. on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000, Editors: G. Pensl, D. Stephani, M. Hundhausen, Trans Tech Publications Ltd (2001).

2. Progress in the industrial production of SiC substrates for semiconductor devices

3. Polytypism and Properties of Silicon Carbide

4. Electron Spin Resonance Studies in SiC

5. EPR and ENDOR Investigations of Shallow Impurities in SiC Polytypes

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