Author:
Thopan Prutchayawoot,Gnaser Hubert,Oki Rika,Aoki Takaaki,Seki Toshio,Matsuo Jiro
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference59 articles.
1. Secondary Ion Mass Spectrometry;Benninghoven,1987
2. TOF-SIMS—Materials Analysis by Mass Spectrometry,2013
3. A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source;Matsuo;Nucl. Instrum. Methods Phys. Res. B,2004
4. The magic of cluster sims;Winograd;Anal. Chem.,2005
5. Molecular secondary ion formation under cluster bombardment: a fundamental review;Wucher;Appl. Surf. Sci.,2006
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