Cationization and fragmentation of molecular ions sputtered from polyethylene glycol under gas cluster bombardment: An analysis by MS and MS/MS

Author:

Thopan Prutchayawoot,Gnaser Hubert,Oki Rika,Aoki Takaaki,Seki Toshio,Matsuo Jiro

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation

Reference59 articles.

1. Secondary Ion Mass Spectrometry;Benninghoven,1987

2. TOF-SIMS—Materials Analysis by Mass Spectrometry,2013

3. A new secondary ion mass spectrometry (SIMS) system with high-intensity cluster ion source;Matsuo;Nucl. Instrum. Methods Phys. Res. B,2004

4. The magic of cluster sims;Winograd;Anal. Chem.,2005

5. Molecular secondary ion formation under cluster bombardment: a fundamental review;Wucher;Appl. Surf. Sci.,2006

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