Author:
Maresca P.,Gómez E.,Caja J.,Barajas C.,Berzal M.
Subject
Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation
Reference32 articles.
1. Large volume metrology process models: a framework for integrating measurement with assembly planning;Maropoulos;CIRP Annals – Manufacturing Technology,2008
2. In-process drilled hole inspection for aerospace applications;Garbini;Precision Engineering,1991
3. Micromanufacturing: International Research and Development;Ehmann,2007
4. Dimensional micro and nano metrology;Hansen;CIRP Annals – Manufacturing Technology,2006
5. A high precision micro/nano CMM using piezoresistive tactile probes Meas;Dai;Sci. Technol.,2009
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献