Comparison of methods for outlier identification in surface characterization

Author:

Wang C.,Caja J.,Gómez E.

Funder

Spanish State Programme of Promotion of Scientific Research and Technique of Excellence, State Sub-programme of Generation of Knowledge

Chinese Scholarship Council

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference34 articles.

1. R. Leach, Optical Measurement of Surface Topography, Springer-Verlag, Berlin Heidelberg, 2011. http://doi.org/10.1007/978-3-642-12012-1.

2. ISO 16610-1:2015, Geometrical Product Specifications (GPS) – Filtration – Part 1: Overview and Basic Concepts.

3. ISO 16269-4:2010, Statistical Interpretation of Data – Part 4: Detection and Treatment of Outliers.

4. Characterization of Structured Surfaces and Assessment of Associated Measurement Uncertainty;MacAulay,2015

5. R. Leach, Characterisation of Areal Surface Texture, Springer-Verlag, Berlin Heidelberg, 2013. http://doi.org/10.1007/978-3-642-36458-7.

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