Gain error, offset error and ENOB estimation of an A/D converter using histogram technique

Author:

Gamad R.S.,Mishra D.K.

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference20 articles.

1. Simple and time effective procedure for ADC INL estimation;Stefani;IEEE Transaction on Instrumentation and Measurement,2006

2. T.E. Linnenbrink, S.J. Tilden, M.T. Miller, ADC testing with IEEE std. 1241–2000, in: Proc. IEEE IMTC, May 2001, pp. 1986–1991.

3. Standard histogram test precision of ADC gain and offset error estimation;Correa Algeria;IEEE Transaction on Instrumentation and Measurement,2007

4. Error in the estimation of transition voltages with the standard histogram test of ADCs’ measurement;Correa Alegria;Elsevier Science B.V.,2004

5. Influence of frequency errors in the variance of the cumulative histogram;Correa Alegria;IEEE Transaction on Instrumentation and Measurements,2003

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