Precision measurement of ADC parameters with cumulative histogram technique using Gaussian noise-Reference-Cited by-同舟云学术

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Precision measurement of ADC parameters with cumulative histogram technique using Gaussian noise

Published:2020-10 Issue: Volume:104 Page:104875
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Garg Bhawana,Mishra D.K.

Publisher

Elsevier BV

Subject

General Engineering

Reference31 articles.

1. Ieee Standard for Terminology and Test Methods for Analog-To-Digital Converters;Daponte,2001

2. Ieee Standard for Terminology and Test Methods for Analog-To-Digital Converters;Tilden,2011

3. Novel ieee-std-1241 based test methods for analog- to-information converter;Silva;EEE Trans. Instrum. Measur.,2019

4. Noise sensitivity of the adc histogram test;Carbone;IEEE Trans. Instrum. Measur.,1998

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