Author:
Rybakov A. A.,Reznichenko N. E.
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. 1241-2010 IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters, 31.200— Integrated Circuits. Microelectronics. http://ieeexplore. ieee.org/servlet/opac?punumber=5692954. Accessed June 1, 2017.
2. Gamad, R.S. and Mishra, D.K., Gain error, offset error and ENOB estimation of an A/D converter using histogram technique, Measurement, 2009, vol. 42, no. 4, pp. 570–576.
3. Gamad, R.S. and Mishra, D.K., Computation of error in estimation of nonlinearity in adc using histogram technique, Engineering, 2011, vol. 3, no. 6, pp. 583–587.
4. Ting, H.-W., Liu, B.-D., and Chang, S.-J., A histogram—based testing method for estimating A/D converter performance, IEEE Trans. Instrum. Meas., 2008, vol. 57, no. 2, pp. 420–427.
5. Alegria, F.A.C., Effective ADC linearity testing using sinewaves, IEEE Trans. Circuits Syst. I: Reg. Papers, 2005, vol. 52, no. 7, pp. 1267–1275.
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