An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy-Reference-Cited by-同舟云学术

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An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy

Published:2017-10 Issue: Volume:108 Page:143-151
ISSN:0263-2241
Container-title:Measurement
language:en
Short-container-title:Measurement

Author:

Flores-Ruiz F.J.,Gervacio-Arciniega J.J.,Murillo-Bracamontes E.,Cruz M.P.,Yáñez-Limón J.M.,Siqueiros J.M.

Funder

PAPIIT-UNAM Proj

CONACYT Proj.

Dirección General de Asuntos del Personal Académico, Universidad Nacional Autónoma de México

Publisher

Elsevier BV

Subject

Applied Mathematics,Electrical and Electronic Engineering,Condensed Matter Physics,Instrumentation

Reference40 articles.

1. Characteristics of a dynamic atomic force microscopy based on a higher-order resonant silicon cantilever and experiments;Huang;Measurement,2016

2. Atomic layer deposition of environmentally benign SnTiOx as a potential ferroelectric material;Chang;J. Vac. Sci. Technol. A Vacuum Surfaces Film,2016

3. Structural, magnetic, and nanoscale switching properties of BiFeO3 thin films grown by pulsed electron deposition;Liu;J. Vac. Sci. Technol., B,2013

4. Ferroelectric properties of manganese doped (Bi1/2Na1/2)TiO3and(Bi1/2Na1/2)TiO3–BaTiO3 epitaxial thin films;Gallegos-Melgar;Appl. Surf. Sci.,2015

5. Simultaneous elastic and electromechanical imaging by scanning probe microscopy: theory and applications to ferroelectric and biological materials;Shin;J. Vac. Sci. Technol. B Microelectron. Nanom. Struct.,2005

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