Fluorine depth analysis using Rutherford backscattering-Reference-Cited by-同舟云学术

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Fluorine depth analysis using Rutherford backscattering

Published:1987-04 Issue: Volume:24-25 Page:682-687
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Khubeis I.G.,Ziegler J.F.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. Proc. on Conf. Ion Beam Surface Layer Analysis,1973

2. Proc. Conf. on Application of Ion Beams to Metals,1974

3. Principles and applications of ion beam techniques for the analysis of solids and thin films

4. On the application of Rutherford scattering and channelling techniques to study semiconductor surfaces

5. Proc. Conf. on Application of Ion Beams to Metals;De Bonte,1974

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantification of low levels of fluorine content in thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-03

2. Analysis by absorption and scattering of radiation;Journal of Radioanalytical and Nuclear Chemistry Articles;1989-06

3. 3S-R10 automated RBS system;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04

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