Author:
Schmidt D.C,Svensson B.G,Barbot J.F,Blanchard C
Subject
Instrumentation,Nuclear and High Energy Physics
Reference16 articles.
1. W. Schröter, M. Seibt, D. Gilles, in: R.W. Cahn, P. Haasen, E.J. Kramer, W. Schröter (Eds.), Materials Science and Technology, VCH, Weinheim, 1991, p. 575
2. Impurity gettering to secondary defects created by MeV ion implantation in silicon
3. Proximity gettering of platinum in proton irradiated silicon
4. D.C. Schmidt, B.G. Svensson, S. Godey, E. Ntsoenzok, J.F. Barbot, C. Blanchard, submitted
5. Spatial confinement and saturation of substitutional platinum by diffusion into ion‐beam damaged silicon
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