Ion beam induced damage in InP during heavy-ion elastic recoil detection analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference12 articles.
1. Mass and energy dispersive recoil spectrometry of MOCVD grown AlxGa1−xAs
2. RBS and recoil spectrometry analysis of CoSi2 formation on GaAs
3. Formation of thin films of CoSi2 on GaAs
4. Metal/InP thin film reactions: Studies using mass and energy dispersive recoil spectrometry
5. Recoil spectrometry of thin film reactions in the Pd/InP system
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Dielectric Studies on Swift Heavy Ions and Electron Irradiated Organic Single Crystal;AIP Conference Proceedings;2011
2. Effect of swift heavy ion (SHI) irradiation on dielectric properties of acetoacetanilide crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-03
3. Damage of InP (110) induced by low energy Ar[sup +] and He[sup +] bombardment;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2000
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