Recoil spectrometry of thin film reactions in the Pd/InP system-Reference-Cited by-同舟云学术

Recoil spectrometry of thin film reactions in the Pd/InP system

Published:1996-07 Issue:4 Volume:14 Page:2405-2413
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Persson Leif,El Bouanani Mohamed,Hult Mikael,Jönsson Patrik,Whitlow Harry J.,Andersson Margaretha,Georgsson Kristina,Bubb Ian F.,Johnston Peter N.,Walker Scott R.,Cohen David D.,Dytlewski Nick,Zaring Carina,Östling Mikael

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.580028

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